Hi Steve,
On 7/6/2011 2:32 PM, Steve at fivetrees wrote:
> On 20/06/2011 18:29, Don Y wrote:
>> [though I question your need to test bare boards at
>> all... look at your artwork and process, first, to
>> decide if this is going to give you any real value
>> for the money spent. A better board house may be
>> the answer]
>
> Some years ago (early 80s) the company I worked at did an analysis of
> faults found and the costs involved in fixing them. It's fairly well
> known that, for every stage of the manufacturing process a board goes
> through, fault rectification costs increase by an order of magnitude. We
The same applies to software development... :> Amusing how few
firms actually address it with the same sense of "rationality"!
(i.e., spec, code, test, test, test, test, test, release)
> made a point of ordering BBT (bare-board test) on every PCB thereafter.
> It was cheap insurance. To be fair, we had recently been hit by a series
> of etching faults, the likes of which I don't see these days...
>
> That was back in the days of double-sided boards. Nowadays, with 6- or
> 8-layer boards, I still do order BBT (it's still cheap). I'd hate to
> have several hundred pounds-worth of components scrapped due to an
> etching fault I can't fix.
I haven't seen a problem that wasn't caught by examining the
"test coupons" alongside the board (checking buried vias, etc.)
The worst problems I've seen were from stuffig the wrong parts
(typically because someone in Purchasing made a decision that
XXX and XXx are "interchangeable" parts -- when, of course, they
weren't!)
> To the OP: more recently (but still about 15 years ago, IIRC) I
> redesigned a bare-board tester for a client. There are various
> strategies, and the best work in the analogue domain and measure e.g.
> resistance. This system worked in the digital domain: basic idea was
> that every pad was probed (bed of nails), and the system typically
> learned a netlist from a known-good new board by driving each node high
> (5V), and recording all other nodes that lit up and so formed a net.
> (There was a bit more to it than that, but hey.) Testing was done by
> repeating this process, comparing the netlists, and (intelligently -
> took a while to perfect) reporting any differences, whether due to
> shorts or opens.
This only catches gross errors. And, at "DC". Things like *sizable*
whiskers or gaps. I.e., a bad annular ring won't turn up until the
board is assembled, flexed, powered, etc.
> Testing time increased as the square of the number of nets. The reason
> for this is left as an exercise for the reader
.
The other dirty little secret is that it requires a lot of time to
SET UP the test in the first place (i.e., what point in the
circuit does pogo pin #87 correspond with?). And, interpreting
the results -- "OK, there's a short between Net 457 and 1933 -- now
*where* is it? Is it a whisker on an internal plane, etc.?"
(since you usually want to *see* the problem to verify it -- or,
has a pogo pin been bent a bit so that *it* is now shorting to
that other net when the clamshell is closed...)
I think the OP is best advised to look at his total process
and see where problems are likely to come in -- unless budget
is not an issue and you can opt for the peace of mind of a
"belts and braces" approach! :>